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Nature Technology Feature – Chemistry

Booking Deadline Mar 07
Publication Name:
Materials Due:
Mar 09
Chemistry: Probing atomic force microscopy
Publication Date:
Mar 22

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Atomic force microscopy can be used to measure the topology and chemical structure of surfaces at the atomic level, often yielding striking images. By dragging a probe over a surface, like a needle in a record player, researchers can probe its height, composition, electronic structure, and more. Yet at the technology’s highest resolution extreme, a controversial claim that it can visualize otherwise ephemeral hydrogen bonding interactions has underscored the key challenges the technology faces.

This technology feature will cover:

  • The technology and applications of AFM
  • Controversies over resolution
  • Advances in AFM methodology

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